Home >  研究会等 > ナノサイエンスセミナー Measurement of resistance induced by a single potassium atom on chiral-angle known nanotubes

ナノサイエンスセミナー Measurement of resistance induced by a single potassium atom on chiral-angle known nanotubes

日程 : 2015年6月1日(月) 13:30 - 15:00 場所 : 物性研究所本館6階 第2セミナー室 (A612) 講師 : Prof. Masa Ishigami 所属 : Department of Physics, University of Central Florida 世話人 : 長谷川 幸雄 (63325)
e-mail: hasegawa@issp.u-tokyo.ac.jp
講演言語 : 日本語

Impurity-induced carrier scattering is expected to be dependent on the chirality of nanotubes and the nature of scattering potentials induced by impurities. Such scattering is still poorly understood because it has been impossible to measure the impact of impurities on resistance of carbon nanotubes with known chirality.
We have measured the scattering strength of charged impurities on semiconducting single-walled carbon nanotubes with known chirality. The resistivity of nanotubes is measured as a function of the density of adsorbed potassium atoms, enabling the determination of the resistance added by an individual potassium atom. Holes are scattered 26 times more efficiently than electrons by an adsorbed potassium atom. The determined scattering strength is used to reveal the spatial extent and depth of the scattering potential for potassium, a model Coulomb adsorbate, paving way for rational design of nanotube-based sensors.


(公開日: 2015年05月23日)