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X-Ray Diffraction Section

Contact PersonHIROI, Zenji
 
Research Associate YAJIMA, Takeshi

The main purposes of the X-Ray Diffraction Section are structural analysis and identification of powder and single crystal specimens for solid state physics. By using the Powder X-ray diffractometer equipped with a refrigerator, the structural analysis is performed in the temperature range of 4-300 K.

X-Ray Diffraction Section

Main Facility

Powder X-ray diffractometer, CCD system for the single-crystal structure analysis, Powder X-ray diffractometer with a refrigerator, Warped imaging plate type diffractometer, Monochromated Laue camera, and Imaging plate reader.

Powder X-ray diffractometer for low temperature application