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Electron Microscope Section

Contact PersonHIROI, Zenji
Technical SpecialistHAMANE, Daisuke

The Electron Microscope Section supports measurements such as electron diffraction, lattice image observations and chemical analyses for various solid materials in both crystalline and non-crystalline forms by using TEM and SEM equipped with EDX analyzer.

Electron Microscope Section

Main Facility

200 kV TEM and SEM with EDX analyzer, high and low-temperature holders, and various apparatuses for sample preparation. electron microscope with an x-ray micro-analyzer, High- and low-temperature holders, and various apparatuses for sample preparation.

200 kV electron microscope with an X-ray micro-analyzer