The Electron Microscope Section supports measurements such as electron diffraction, lattice image observations and chemical analyses for various solid materials in both crystalline and non-crystalline forms by using TEM and SEM equipped with EDX analyzer.

200 kV TEM and SEM with EDX analyzer, high and low-temperature holders, and various apparatuses for sample preparation. electron microscope with an x-ray micro-analyzer, High- and low-temperature holders, and various apparatuses for sample preparation.