Electron Microscope Section
Contact PersonHIROI, Zenji
Technical SpecialistHAMANE, Daisuke
The Electron Microscope Section supports measurements such as electron diffraction, lattice image observations and chemical analyses for various solid materials in both crystalline and non-crystalline forms by using TEM and SEM equipped with EDX analyzer.
Main Facility
200 kV TEM and SEM with EDX analyzer, high and low-temperature holders, and various apparatuses for sample preparation. electron microscope with an x-ray micro-analyzer, High- and low-temperature holders, and various apparatuses for sample preparation.
