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XTIP – A dedicated beamline for synchrotron X-ray scanning tunneling microscopy

Date : Monday, December 9th, 2019 13:30 - 14:30 Place : Seminar Room 5 (A615), 6th Floor, ISSP Lecturer : Dr. Nozomi Shirato Affiliation : Center for Nanoscale Materials, Argonne National Laboratory Committee Chair : Yukio Hasegawa

A result of combining synchrotron X-ray radiation and scanning probe microscopy is a powerful microscope which can image and examine materials with unprecedented details. Synchrotron X-ray scanning tunneling microscopy (SX-STM) is designed for real space imaging of objects on a surface at the atomic limit and simultaneously obtaining electronic, chemical or magnetic contrast. At Advanced Photon Source in Argonne National Laboratory, XTIP beamline, the world’s first dedicated beamline for SX-STM has been constructed. The beamline mainly consists of circular and linear polarizer with switching rate of 1Hz, a spherical grating monochromator with more than 4000 resolving power and KB mirrors to focus beam down to tens of micrometer. The beamline can produce a photon flux of 1011-1013 photons per second at 1keV. The capabilities of the beamline will benefit the communities to explore chemical, magnetic and electronic properties of materials at atomic resolution. Recently, a commissioning of the beamline has been conducted, and in this talk, preliminary status of the beamline and measurements from commissioning will be discussed.


(Published on: Tuesday December 3rd, 2019)