ISSP - The institute for Solid State Physics

Lab & Organization
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X-Ray Diffraction Section
Contact
Person
HIROI,
Zenji

Research Associate
YAJIMA,
Takeshi

To The Section's Homepage Japanese Only

The main purposes of the X-Ray Diffraction Section are structural analysis and identification of powder and single crystal specimens for solid state physics. By using the 4-circle diffractometer equipped with a warped imaging plate and a refrigerator, the structural analysis is performed in the temperature range of 7-300 K.


Main Facilities
  • Powder X-ray diffractometer
  • CCD system for the single-crystal structure analysis
  • Automatic 4-circle X-ray diffractometer
  • Warped imaging plate type diffractometer
  • Monochromated Laue camera
  • Imaging plate reader.

Imaging plate type X-ray diffractometer for low temperature application